M40X Metallurgical Semiconductor Inspection Microscope

The Fein Optic M40X metallurgical semiconductor inspection microscope with reflected illumination is available with brightfield or brightfield/darkfield. The microscope has a larger working surface and high intensity LED illumination. Observation techniques include polarization, brightfield, darkfield, and DIC. A variety of objective lenses are available.

Optical System  Infinity Color Corrected Achromatic Optical System 
Observation M40X: Brightfield, Oblique Illumination, Polarization, DIC
M40X-BD: Brightfield, Darkfield, Polarization, DIC
Viewing Head  25° Inclined trinocular viewing head, erect image. Splitting ration: 100:0 or 0:100. Diopter adjustment +/-5. Interpupillary distance adjustable from 54mm – 75mm.
Eyepieces High eyepoint WF PL10x / 22mm.
Objectives Infinity Corrected LWD Brightfield Plan Achromat 5x, 10x, 20x, 50x, 100x.
Infinity Corrected LWD Brightfield Darkfield Plan Achromat 5x, 10x, 20x, 50x, 100x.
Infinity Corrected High Resolution Brightfield Darkfield Semi Apo Objectives 5x, 10x, 20x, 50x, 100x.
Infinity Corrected Brightfield Darkfield Plan Achromat 5x, 10x, 20x, 50x, 100x.
Nosepiece M40X: Tilted quintuple nosepiece for brightfield with DIC slot.
M40X-BD: Tilted quintuple nosepiece for brightfield, darkfield, with DIC slot.
Focus Adjustment Coaxial coarse and fine focus mechanism, coarse range: 32mm, fine precision: 0.002mm. With tension adjustment.
Power Auto voltage sending power supply 96~264V wide voltage system.
Stage Large flat base 320mm x 260mm x 16mm. Post height 280mm, 32mm diameter post.
Illumination High intensity LED fiber optic illuminator with on board thermal sensors, 80W, 25,000 hours lifetime. Auto voltage sensing power supply 96~264VAC, 50-60Hz.
Polarization/DIC Polarizer, fixed analyzer, 360 degree rotatable analyzer, DIC slider.
C-Mount Adapter 0.5x, 0.65x, 1x C-Mount Adapters.